company news_news_Shandong Chuangpu Optical Instrument Co., Ltd.

Working environment and storage method of wafer probe station

The wafer probe station should be placed on a stable and reliable table, preferably on a worktable with anti-vibration device, and avoid using it unde...

time：2021-12-14

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The main purpose and performance parameters of the probe station

Product overview of high and low temperature vacuum probe station can carry out high and low temperature test in vacuum environment (4.2K~500K), can b...

time：2021-12-14

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Probe station maintenance and maintenance

Precautions for purchasing manual probe station Because manual probe station is a highly customized product, there is no unified standard. Each unit c...

time：2021-12-14

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Probe station classification introduction and how to maintain and maintain

The probe station is distinguished by operation: manual, semi-automatic, and fully automatic. From the functional point of view, there are: temperatur...

time：2021-12-14

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Three categories of probe stations

The classification of the probe station The probe station can be divided according to the use type and function, and can also be divided into: manual ...

time：2021-12-14

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What are the parts of the probe station?

Sample stage (stage): It is a component device for positioning wafers or chips. The size is usually designed according to the size of the wafer, and t...

time：2021-12-14

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Technical index and usage method of high and low temperature vacuum microwave probe station

The high and low temperature vacuum microwave probe station is a process test instrument used in the field of electronics and communication technology...

time：2021-12-14

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Precautions for the selection of probe station

Probe station is a very professional instrument, its main function is to detect semiconductor components, which refers to the testing of integrated ci...

time：2021-12-14

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The purpose of manual probe station and how to use it

Probe stations are mainly used in semiconductor industry, optoelectronic industry, integrated circuit and packaging testing. It is widely used in the ...

time：2021-12-14

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Wafer test and probe station

Wafer testing is a step performed in the manufacturing process of semiconductor devices. In this step, performed before the wafer is sent to chip prep...

time：2021-12-14

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